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nanome|x 180 + CT
nanome|x 180 + CT – The high-end X-ray system for 2D-and 3D analysis (computed tomography)
Technical data
nanome|x 180
High-resolution X-ray system for the inspection of high-quality structure-and connection technology
Technical data
The Test system
nanome|x 180 + CT
Technical data and configuration
X-ray tube: micro- / nanofocus transmission tube (open)
Tube voltage: 180 kV
Max. Tube power: 20 W
Target: Diamond window
X-ray detector: 2 MPixel image intensifier (BV) + digital detector GE DXR250RT
temperature stabilized with active cooling
Pixel: 1000 x 1000
Resolution: 200 x 200 µm
Frame rate: up to 30 fps in full screen mode
Manipulator: High-precision synchronized vibration-free 5-axis manipulation
Max. Transmitted light area: 460 mm x 360 mm
Max. Specimen size/weight: 680 mm x 635mm / 10 kg
Oblique transmission: continuously adjustable. Projection angle up to 70°, rotation 0°-360°
Rotation and tilt unit: tilt +/- 45°, rotation n 360°, up to 2 kg
CT unit: precision rotation axis
System enlargement:
Geometric magnification (DXR detector): 1,970x
Total magnification (DXR detector): max. 2,660x
System resolution:
Detail detectability down to 0.2 µm (in 2D mode)
3D mode (CT):
Max. Max. geometric magnification: 100x
Max. Voxel resolution: up to 2 µm, depending on sample size
Volume acquisition and reconstruction software: phoenix datos|x
Software modules:
bga|module
for automatic BGA solder joint control
vc|module
for automatic pore evaluation
The test systems
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The Test system
nanome|x 180
Technical data and configuration
X-ray tube: micro- / nanofocus transmission tube (open)
Tube voltage: 180 kV
Max. Tube power: 15 W
Target: Tungsten
X-ray detector:
Digital image chain with high resolution 4″ dual-field image intensifier
2MPixel digital camera and 24″ TFT display
Manipulator: High-precision synchronized vibration-free 5-axis manipulation
Max. Transmitted light area: 460 mm x 360 mm
Max. Specimen size/weight: 680 mm x 635mm / 10 kg
Oblique transmission: continuously adjustable. Projection angle up to 70°, rotation 0°-360°
Rotation and tilt unit: tilt +/- 45°, rotation n 360°, up to 2 kg
System enlargement :
Geometric magnification up to 1,630x
Total magnification up to 17,490x
System resolution:
Detail detectability down to 0.2 µm (200nm)
3D mode (CT):
CT Preparation for future CT upgrade
Software modules:
bga|module
for automatic BGA solder joint control
vc|module
for automatic pore evaluation
The test systems
Load more
We are looking forward to your inquiry!
Contact us
2D X-ray analysis
3D computed tomography (CT)
Test systems
About us
Contact
2D X-ray analysis
3D computed tomography (CT)
Test systems
About us
Contact